Low Forward Voltage III-Nitride Red Micro-Light-Emitting Diodes on a Strain Relaxed Template with an InGaN Decomposition Layer

TitleLow Forward Voltage III-Nitride Red Micro-Light-Emitting Diodes on a Strain Relaxed Template with an InGaN Decomposition Layer
Publication TypeJournal Article
Year of Publication2022
AuthorsWong, M. S., P. Chan, N. Lim, H. Zhang, R. C. White, J. S. Speck, S. P. DenBaars, and S. Nakamura
JournalCrystals
Volume12
Pagination721
ISSN2073-4352
Abstract

In this study, III-nitride red micro-light-emitting diodes (µLEDs) with ultralow forward voltage are demonstrated on a strain relaxed template. The forward voltage ranges between 2.00 V and 2.05 V at 20 A/cm2 for device dimensions from 5 × 5 to 100 × 100 µm2. The µLEDs emit at 692 nm at 5 A/cm2 and 637 nm at 100 A/cm2, corresponding to a blueshift of 55 nm due to the screening of the internal electric field in the quantum wells. The maximum external quantum efficiency and wall-plug efficiency of µLEDs are 0.31% and 0.21%, respectively. This suggests that efficient III-nitride red µLEDs can be realized with further material optimizations.

URLhttps://www.mdpi.com/2073-4352/12/5/721
DOI10.3390/cryst12050721