Direct measurement of hot-carrier generation in a semiconductor barrier heterostructure: Identification of the dominant mechanism for thermal droop

TitleDirect measurement of hot-carrier generation in a semiconductor barrier heterostructure: Identification of the dominant mechanism for thermal droop
Publication TypeJournal Article
Year of Publication2019
AuthorsMyers, D. J., K. Gel, A. I. Alhassan, L. Martinelli, J. Peretti, S. Nakamura, C. Weisbuch, and J. S. Speck
JournalPhys. Rev. B
Volume100
Pagination125303
Date PublishedSep
URLhttps://link.aps.org/doi/10.1103/PhysRevB.100.125303
DOI10.1103/PhysRevB.100.125303