Characterization of traps in AlGaN/GaN HEMTs with a combined large signal network analyzer/deep level optical spectrometer system

TitleCharacterization of traps in AlGaN/GaN HEMTs with a combined large signal network analyzer/deep level optical spectrometer system
Publication TypeConference Paper
Year of Publication2009
AuthorsYang, C-K., P. Roblin, A. Malonis, A. Arehart, S. Ringel, C. Poblenz, Y. Pei, J. Speck, and U. Mishra
Conference NameMicrowave Symposium Digest, 2009. MTT'09. IEEE MTT-S International
PublisherIEEE