Publications

Found 2 results
Author Title Type [ Year(Asc)]
Filters: Author is X.M. Cheng  [Clear All Filters]
2008
D.S. Gianola, B.G. Mendis, X.M. Cheng, and K.J. Hemker. "Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films." Materials Science and Engineering: A 483-484 (2008): 637-640. (476.67 KB)
D.S. Gianola, C. Eberl, X.M. Cheng, and K.J. Hemker. "Stress-driven surface topography evolution in nanocrystalline Al thin films." Advanced Materials 20 (2008): 303-308. (410.64 KB)