Stress-driven surface topography evolution in nanocrystalline Al thin films

TitleStress-driven surface topography evolution in nanocrystalline Al thin films
Publication TypeJournal Article
Year of Publication2008
AuthorsD.S. Gianola, C. Eberl, X.M. Cheng, and K.J. Hemker
JournalAdvanced Materials
Volume20
Pagination303–308
DOI10.1002/adma.200701607