Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films

TitleGrain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films
Publication TypeJournal Article
Year of Publication2008
AuthorsD.S. Gianola, B.G. Mendis, X.M. Cheng, and K.J. Hemker
JournalMaterials Science and Engineering: A
Volume483-484
Pagination637–640
DOI10.1007/s11661-002-0256-5