Publications

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Author Title Type [ Year(Desc)]
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2012
Hu, Y., S. Kraemer, JS. Speck, and PT. Fini, "HAADF-STEM and TEM Investigation on the Structure of ${$-2110$}$ Prismatic Stacking Faults in a-plane GaN", Microscopy and Microanalysis, vol. 18, no. S2: Cambridge University Press, pp. 1342, 2012.