Publications

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2000
Zhao, L., JS. Speck, R. Rajavel, J. Jensen, D. Leonard, T. Strand, and W. Hamilton, "Transmission electron microscopy studies of defects in HgCdTe device structures grown by molecular beam epitaxy", Journal of Electronic Materials, vol. 29, no. 6: Springer-Verlag, pp. 732–735, 2000.