Publications

Found 7 results
Author Title Type [ Year(Desc)]
Filters: Author is Haeger, DA  [Clear All Filters]
2010
Farrell, RM., DA. Haeger, X. Chen, M. Iza, A. Hirai, KM. Kelchner, K. Fujito, A. Chakraborty, S. Keller, SP. DenBaars, et al., "Effect of carrier gas and substrate misorientation on the structural and optical properties of m-plane InGaN/GaN light-emitting diodes", Journal of Crystal Growth, vol. 313, no. 1: Elsevier, pp. 1–7, 2010.
Farrell, RM., PS. Hsu, DA. Haeger, K. Fujito, SP. DenBaars, JS. Speck, and S. Nakamura, "Low-threshold-current-density AlGaN-cladding-free m-plane InGaN/GaN laser diodes", Applied Physics Letters, vol. 96, no. 23: AIP, pp. 231113, 2010.
Farrell, RM., DA. Haeger, X. Chen, CS. Gallinat, RW. Davis, M. Cornish, K. Fujito, S. Keller, SP. DenBaars, S. Nakamura, et al., "Origin of pyramidal hillocks on GaN thin films grown on free-standing m-plane GaN substrates", Applied Physics Letters, vol. 96, no. 23: AIP, pp. 231907, 2010.
2011
Farrell, RM., DA. Haeger, PS. Hsu, K. Fujito, DF. Feezell, SP. DenBaars, JS. Speck, and S. Nakamura, "Determination of internal parameters for AlGaN-cladding-free m-plane InGaN/GaN laser diodes", Applied Physics Letters, vol. 99, no. 17: AIP, pp. 171115, 2011.
Hardy, MT., RM. Farrell, P. S. Hsu, DA. Haeger, K. Kelchner, K. Fujito, A. Chakraborty, DA. Cohen, S. Nakamura, JS. Speck, et al., "Effect of n-AlGaN cleave assistance layers on the morphology of c-plane cleaved facets for m-plane InGaN/GaN laser diodes", physica status solidi (c), vol. 8, no. 7-8: Wiley Online Library, pp. 2226–2228, 2011.
Farrell, RM., DA. Haeger, PS. Hsu, MC. Schmidt, K. Fujito, DF. Feezell, SP. DenBaars, JS. Speck, and S. Nakamura, "High-power blue-violet AlGaN-cladding-free m-plane InGaN/GaN laser diodes", Applied Physics Letters, vol. 99, no. 17: AIP, pp. 171113, 2011.
2013
Farrell, RM., DA. Haeger, K. Fujito, SP. DenBaars, S. Nakamura, and JS. Speck, "Morphological evolution of InGaN/GaN light-emitting diodes grown on free-standing m-plane GaN substrates", Journal of Applied Physics, vol. 113, no. 6: AIP, pp. 063504, 2013.