Modeling dislocation-related leakage currents in GaN p-n diodes

TitleModeling dislocation-related leakage currents in GaN p-n diodes
Publication TypeJournal Article
Year of Publication2019
AuthorsRobertson, C. A., K. S. Qwah, Y.-R. Wu, and J. S. Speck
JournalJournal of Applied Physics
Volume126
Pagination245705
URLhttps://doi.org/10.1063/1.5123394
DOI10.1063/1.5123394