Deep level defects in Ge-doped (010) β-Ga2O3 layers grown by plasma-assisted molecular beam epitaxy

TitleDeep level defects in Ge-doped (010) β-Ga2O3 layers grown by plasma-assisted molecular beam epitaxy
Publication TypeJournal Article
Year of Publication2018
AuthorsFarzana, E., E. Ahmadi, J. S. Speck, A. R. Arehart, and S. A. Ringel
JournalJournal of Applied Physics
Volume123
Pagination161410