Scanning near-field microscopy of carrier lifetimes in m-plane InGaN quantum wells

TitleScanning near-field microscopy of carrier lifetimes in m-plane InGaN quantum wells
Publication TypeJournal Article
Year of Publication2017
AuthorsIvanov, R., S. Marcinkevičius, T. K. Uždavinys, L. Y. Kuritzky, S. Nakamura, and J. S. Speck
JournalApplied Physics Letters
Volume110
Pagination031109