Correlation of a generation-recombination center with a deep level trap in GaN

TitleCorrelation of a generation-recombination center with a deep level trap in GaN
Publication TypeJournal Article
Year of Publication2015
AuthorsNguyen, X. Sang, K. Lin, Z. Zhang, B. McSkimming, AR. Arehart, JS. Speck, SA. Ringel, E. A. Fitzgerald, and SJ. Chua
JournalApplied Physics Letters
Volume106
Pagination102101