| Title | Condensed Matter: Electronic Properties, etc.-Characterization of Individual Threading Dislocations in GaN Using Ballistic Electron Emission Microscopy |
| Publication Type | Journal Article |
| Year of Publication | 2001 |
| Authors | Im, HJ., Y. Ding, JP. Pelz, B. Heying, and JS. Speck |
| Journal | Physical Review Letters |
| Volume | 87 |
| Pagination | 106802–106802 |