| Title | Atom Probe Tomography of III-Nitrides Based Semiconducting Devices |
| Publication Type | Journal Article |
| Year of Publication | 2013 |
| Authors | Shivaraman, R., Y-R. Wu, S. Choi, R. Chung, and J. Speck |
| Journal | Microscopy and Microanalysis |
| Volume | 19 |
| Pagination | 956–957 |