| Title | Spatial Localization and Variation in Defect-Related Electron Traps in GaN Materials |
| Publication Type | Journal Article |
| Year of Publication | 2015 |
| Authors | Galiano, K., D. Gleason, P. Krishna Paul, Z. Zhang, D. Cardwell, B. McSkimming, J. Speck, A. Arehart, S. Ringel, and J. Pelz |
| Journal | Bulletin of the American Physical Society |