| Title | Polarity determination for MOCVD growth of GaN on Si (111) by convergent beam electron diffraction |
| Publication Type | Journal Article |
| Year of Publication | 2000 |
| Authors | Zhao, L., H. Marchand, P. Fini, SP. DenBaars, UK. Mishra, and JS. Speck |
| Journal | Materials Research Society Internet Journal of Nitride Semiconductor Research |
| Volume | 5 |
| Pagination | 104–110 |