Measurement and minimization of wing tilt in laterally overgrown GaN on a SiO ${$sub 2$}$ mask.

TitleMeasurement and minimization of wing tilt in laterally overgrown GaN on a SiO ${$sub 2$}$ mask.
Publication TypeMiscellaneous
Year of Publication2000
AuthorsFini, P., L. Zhao, J. S. Speck, S. P. DenBaars, A. Munkholm, C. Thompson, GB. Stephenson, JA. Eastman, RMV. Murty, and O. Auciello