Low damage dry etch for III-nitride light emitters

TitleLow damage dry etch for III-nitride light emitters
Publication TypeJournal Article
Year of Publication2015
AuthorsNedy, J. G., N. G. Young, K. M. Kelchner, Y. Hu, R. M. Farrell, S. Nakamura, S. P. DenBaars, C. Weisbuch, and J. S. Speck
JournalSemiconductor Science and Technology
Volume30
Pagination085019