Electrical characterization of low defect density nonpolar (11\= 2 0) a-plane GaN grown with sidewall lateral epitaxial overgrowth (SLEO)

TitleElectrical characterization of low defect density nonpolar (11\= 2 0) a-plane GaN grown with sidewall lateral epitaxial overgrowth (SLEO)
Publication TypeJournal Article
Year of Publication2008
AuthorsImer, B., B. Haskell, S. Rajan, S. Keller, U. K. Mishra, S. Nakamura, J. S. Speck, and S. P. DenBaars
JournalJournal of Materials Research
Volume23
Pagination551–555