m-plane (10 1\= 0) and (20 2\= 1) GaN/AlxGa1–xN conduction band offsets measured by capacitance-voltage profiling

Titlem-plane (10 1\= 0) and (20 2\= 1) GaN/AlxGa1–xN conduction band offsets measured by capacitance-voltage profiling
Publication TypeJournal Article
Year of Publication2014
AuthorsHurni, C. A., H. Kroemer, U. K. Mishra, and J. S. Speck
JournalApplied Physics Letters
Volume105
Pagination232108