| Title | In situ characterization of GaN quantum dot growth with reflection high-energy electron diffraction and line-of-sight mass spectrometry |
| Publication Type | Journal Article |
| Year of Publication | 2006 |
| Authors | Brown, J. S., G. Koblmüller, R. Averbeck, H. Riechert, and J. S. Speck |
| Journal | Journal of applied physics |
| Volume | 99 |
| Pagination | 124909 |