Influence of growth temperature and temperature ramps on deep level defect incorporation in m-plane GaN

TitleInfluence of growth temperature and temperature ramps on deep level defect incorporation in m-plane GaN
Publication TypeJournal Article
Year of Publication2013
AuthorsArmstrong, AM., K. Kelchner, S. Nakamura, SP. DenBaars, and J. S. Speck
JournalApplied Physics Letters
Volume103
Pagination232108