| Title | Characterization of crystallographic properties and defects via X-ray microdiffraction in GaN (0001) layers |
| Publication Type | Journal Article |
| Year of Publication | 2006 |
| Authors | Barabash, R. I., O. M. Barabash, G. E. Ice, C. Roder, S. Figge, S. Einfeldt, D. Hommel, TM. Katona, JS. Speck, SP. DenBaars, and others |
| Journal | physica status solidi (a) |
| Volume | 203 |
| Pagination | 142–148 |