| Title | Atom probe tomography studies of Al2O3 gate dielectrics on GaN |
| Publication Type | Journal Article |
| Year of Publication | 2014 |
| Authors | Mazumder, B., X. Liu, R. Yeluri, F. Wu, U. K. Mishra, and J. S. Speck |
| Journal | Journal of Applied Physics |
| Volume | 116 |
| Pagination | 134101 |