| Title | Characterization of a dielectric/GaN system using atom probe tomography |
| Publication Type | Journal Article |
| Year of Publication | 2013 |
| Authors | Mazumder, B., M. Esposto, T. H. Hung, T. Mates, S. Rajan, and J. S. Speck |
| Journal | Applied Physics Letters |
| Volume | 103 |
| Pagination | 151601 |