| Title | Temperature Dependent Capacitance–Voltage Analysis of Unintentionally Doped and Si Doped Al0. 82In0. 18N Grown on GaN |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Chung, R. B., O. Bierwagen, F. Wu, S. Keller, S. P. DenBaars, J. S. Speck, and S. Nakamura |
| Journal | Japanese Journal of Applied Physics |
| Volume | 50 |
| Pagination | 101001 |