| Title | Direct Determination of Energy Band Alignments of Ni/Al 2 O 3/GaN MOS Structures Using Internal Photoemission Spectroscopy |
| Publication Type | Journal Article |
| Year of Publication | 2014 |
| Authors | Zhang, Z., C. M. Jackson, A. R. Arehart, B. McSkimming, J. S. Speck, and S. A. Ringel |
| Journal | Journal of electronic materials |
| Volume | 43 |
| Pagination | 828–832 |