| Title | Effect of quantum well cap layer thickness on the microstructure and performance of InGaN/GaN solar cells |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Hu, Y-L., R. M. Farrell, C. J. Neufeld, M. Iza, S. C. Cruz, N. Pfaff, D. Simeonov, S. Keller, S. Nakamura, S. P. DenBaars, and others |
| Journal | Applied Physics Letters |
| Volume | 100 |
| Pagination | 161101 |