| Title | Hall and Seebeck profiling: Determining surface, interface, and bulk electron transport properties in unintentionally doped InN |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Bierwagen, O., S. Choi, and J. S. Speck |
| Journal | Physical Review B |
| Volume | 84 |
| Pagination | 235302 |