Hall and Seebeck measurement of a p-n layer stack: Determining InN bulk hole transport properties in the presence of a strong surface electron accumulation layer

TitleHall and Seebeck measurement of a p-n layer stack: Determining InN bulk hole transport properties in the presence of a strong surface electron accumulation layer
Publication TypeJournal Article
Year of Publication2012
AuthorsBierwagen, O., S. Choi, and J. S. Speck
JournalPhysical Review B
Volume85
Pagination165205