| Title | Trace analysis of non-basal plane misfit stress relaxation in (20 2\= 1) and (30 3\= 1\=) semipolar InGaN/GaN heterostructures |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Hardy, M. T., P. Shan Hsu, F. Wu, I. L. Koslow, E. C. Young, S. Nakamura, A. E. Romanov, S. P. DenBaars, and J. S. Speck |
| Journal | Applied Physics Letters |
| Volume | 100 |
| Pagination | 202103 |