| Title | Structural characterization of thick GaN films grown on free-standing GaN seeds by the ammonothermal method using basic ammonia |
| Publication Type | Journal Article |
| Year of Publication | 2005 |
| Authors | Hashimoto, T., K. Fujito, F. Wu, B. A. Haskell, P. T. Fini, J. S. Speck, and S. Nakamura |
| Journal | Japanese journal of applied physics |
| Volume | 44 |
| Pagination | L797 |