| Title | Characterization of individual threading dislocations in GaN using ballistic electron emission microscopy |
| Publication Type | Journal Article |
| Year of Publication | 2001 |
| Authors | Im, H-J., Y. Ding, JP. Pelz, B. Heying, and JS. Speck |
| Journal | Physical review letters |
| Volume | 87 |
| Pagination | 106802 |
