Effect of charged dislocation scattering on electrical and electrothermal transport in n-type InN

TitleEffect of charged dislocation scattering on electrical and electrothermal transport in n-type InN
Publication TypeJournal Article
Year of Publication2011
AuthorsMiller, N., E. E. Haller, G. Koblmüller, C. Gallinat, J. S. Speck, W. J. Schaff, M. E. Hawkridge, K. Man Yu, and J. W. Ager III
JournalPhysical Review B
Volume84
Pagination075315