Capture Kinetics of Electron Traps in MBE-Grown n-GaN

TitleCapture Kinetics of Electron Traps in MBE-Grown n-GaN
Publication TypeJournal Article
Year of Publication2001
AuthorsHierro, A., AR. Arehart, B. Heying, M. Hansen, JS. Speck, UK. Mishra, SP. DenBaars, and SA. Ringel
Journalphysica status solidi (b)
Volume228
Pagination309–313