| Title | Determination of tilt in the lateral epitaxial overgrowth of GaN using X-ray diffraction |
| Publication Type | Journal Article |
| Year of Publication | 2000 |
| Authors | Fini, P., H. Marchand, JP. Ibbetson, SP. DenBaars, UK. Mishra, and JS. Speck |
| Journal | Journal of crystal growth |
| Volume | 209 |
| Pagination | 581–590 |