| Title | Correlated scanning Kelvin probe and conductive atomic force microscopy studies of dislocations in gallium nitride |
| Publication Type | Journal Article |
| Year of Publication | 2003 |
| Authors | Simpkins, BS., ET. Yu, P. Waltereit, and JS. Speck |
| Journal | Journal of applied physics |
| Volume | 94 |
| Pagination | 1448–1453 |