Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. III. Interfacial defects and domain misorientations

TitleDomain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. III. Interfacial defects and domain misorientations
Publication TypeJournal Article
Year of Publication1995
AuthorsSpeck, JS., AC. Daykin, A. Seifert, AE. Romanov, and W. Pompe
JournalJournal of applied physics
Volume78
Pagination1696–1706