| Title | Scanning capacitance microscopy imaging of threading dislocations in GaN films grown on (0001) sapphire by metalorganic chemical vapor deposition |
| Publication Type | Journal Article |
| Year of Publication | 1998 |
| Authors | Hansen, PJ., YE. Strausser, AN. Erickson, EJ. Tarsa, P. Kozodoy, EG. Brazel, JP. Ibbetson, U. Mishra, V. Narayanamurti, SP. DenBaars, and others |
| Journal | Applied physics letters |
| Volume | 72 |
| Pagination | 2247–2249 |