Origin of defect-insensitive emission probability in In-containing (Al, In, Ga) N alloy semiconductors

TitleOrigin of defect-insensitive emission probability in In-containing (Al, In, Ga) N alloy semiconductors
Publication TypeJournal Article
Year of Publication2006
AuthorsChichibu, S. F., A. Uedono, T. Onuma, B. A. Haskell, A. Chakraborty, T. Koyama, P. T. Fini, S. Keller, S. P. DenBaars, J. S. Speck, and others
JournalNature materials
Volume5
Pagination810