| Title | Electrical and structural characterizations of crystallized Al2O3/GaN interfaces formed by in situ metalorganic chemical vapor deposition |
| Publication Type | Journal Article |
| Year of Publication | 2016 |
| Authors | Liu, X., CM. Jackson, F. Wu, B. Mazumder, R. Yeluri, J. Kim, S. Keller, AR. Arehart, SA. Ringel, JS. Speck, and others |
| Journal | Journal of Applied Physics |
| Volume | 119 |
| Pagination | 015303 |