| Title | Transmission electron microscopy studies of defects in HgCdTe device structures grown by molecular beam epitaxy |
| Publication Type | Journal Article |
| Year of Publication | 2000 |
| Authors | Zhao, L., JS. Speck, R. Rajavel, J. Jensen, D. Leonard, T. Strand, and W. Hamilton |
| Journal | Journal of Electronic Materials |
| Volume | 29 |
| Pagination | 732–735 |