| Title | Comparative analysis of 20 2\= 1 and 20 2\= 1\= semipolar GaN light emitting diodes using atom probe tomography |
| Publication Type | Journal Article |
| Year of Publication | 2013 |
| Authors | Shivaraman, R., Y. Kawaguchi, S. Tanaka, SP. DenBaars, S. Nakamura, and JS. Speck |
| Journal | Applied Physics Letters |
| Volume | 102 |
| Pagination | 251104 |