Carrier Trapping and Recombination at Point Defects and Dislocations in MOCVD n-GaN

TitleCarrier Trapping and Recombination at Point Defects and Dislocations in MOCVD n-GaN
Publication TypeJournal Article
Year of Publication2001
AuthorsHierro, A., M. Hansen, L. Zhao, JS. Speck, UK. Mishra, SP. DenBaars, and SA. Ringel
Journalphysica status solidi (b)
Volume228
Pagination937–946