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Filters: Keyword is Scanning electron microscopy [Clear All Filters]
Serial sectioning in the SEM for three dimensional materials science. Current Opinion in Solid State and Materials Science. :100817.. 2020.
Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging. Ultramicroscopy. 195:93–100.. 2018.
Measurements of plastic localization by heaviside-digital image correlation. Acta Materialia. 157:307–325.. 2018.