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Witzen W, Polonsky A, Rottmann P, Pusch K, Echlin M, Pollock T, Beyerlein I.  2022.  Boundary characterization using 3D mapping of geometrically necessary dislocations in AM Ta microstructure. Journal of Materials Science. 57
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Witzen W, Echlin M, Charpagne M-agathe, Pollock T, Beyerlein I.  2022.  Subgrain geometrically necessary dislocation density mapping in spalled Ta in three dimensions. Acta Materialia. 244:118366.