Publications

Found 2 results
Author Title Type [ Year(Desc)]
Filters: Author is Bammes, Benjamin  [Clear All Filters]
2020
Wang, Fulin, McLean Echlin, Jungho Shin, Benjamin Bammes, Marc De Graef, Tresa Pollock, and Daniel Gianola. "Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection." Microscopy and Microanalysis 26 (2020): 1164-1165.
2021
Wang, Fulin, McLean P. Echlin, Aidan A. Taylor, Jungho Shin, Benjamin Bammes, Barnaby DA Levin, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition." Ultramicroscopy 220 (2021): 113160.