Optical measurement of thermal contact conductance between wafer-like thin solid samples

TitleOptical measurement of thermal contact conductance between wafer-like thin solid samples
Publication TypeJournal Article
Year of Publication1999
AuthorsOhsone, Y, G Wu, J Dryden, F Zok, and A Majumdar
JournalJOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME
Volume121
Pagination954-963
Date PublishedNOV
ISSN0022-1481
DOI10.1115/1.2826086