Publications

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Author Title Type [ Year(Asc)]
Filters: Author is Echlin, Mclean P. and Keyword is SEM  [Clear All Filters]
2021
Wang F, Echlin MP, Taylor AA, Shin J, Bammes B, Levin BDA, De Graef M, Pollock TM, Gianola DS.  2021.  Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy. 220:113160.
2018
Lenthe WC, Stinville JCharles, Echlin MP, Chen Z, Daly S, Pollock TM.  2018.  Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging. Ultramicroscopy. 195:93–100.